Tensile Testing of Insulating Thin Films Using Electrostatic Force Grip
نویسندگان
چکیده
منابع مشابه
Ferromagnetic insulating state in tensile-strained LaCoO3 thin films from LDA+U calculations
With local density approximation+Hubbard U (LDA+U ) calculations, we show that the ferromagnetic (FM) insulating state observed in tensile-strained LaCoO3 epitaxial thin films is most likely a mixture of low-spin (LS) and high-spin (HS) Co, namely, a HS/LS mixture state. Compared with other FM states, including the intermediate-spin (IS) state (metallic within LDA+U ), which consists of IS Co o...
متن کاملDielectric properties of thin insulating layers measured by Electrostatic Force Microscopy
In order to measure the dielectric permittivity of thin insulting layers, we developed a method based on electrostatic force microscopy (EFM) experiments coupled with numerical simulations. This method allows to characterize the dielectric properties of materials without any restrictions of film thickness, tip radius and tip-sample distance. The EFM experiments consist in the detection of the e...
متن کاملLocal Electrostatic Charging of Semiconductor Thin Films
A nanocrystalline diamond (NCD) thin film (80 nm) is deposited on a p-type Si substrate and oxygen terminated by radio frequency (r.f.) oxygen plasma. An atomic force microscope (AFM) is used to induce electrostatically charged micrometer-sized areas on the diamond film by applying a bias voltage on the AFM tip during contact mode scan. Trapped charge is detected by Kelvin force microscopy (KFM...
متن کاملQuenched growth of nanostructured lead thin films on insulating substrates
Lead island films were obtained via vacuum vapor deposition on glass and ceramic substrates at 80 K. Electrical conductance was measured during vapor condensation and further annealing of the film up to room temperature. The resistance behavior during film formation and atomic force microscopy of annealed films were used as information sources about their structure. A model for the quenched gro...
متن کاملElastic Properties of Metallic Thin Films: 2d Synchrotron Xrd Analysis during in Situ Tensile Testing
Elastic behavior of thin films studied from in situ loading of the specimen during X-ray diffraction on a synchrotron source is presented. Model nanometric multilayer W/Au systems exhibiting different microstructures were analyzed. These films are supported by a (thin) polyimide substrate. X-ray diffraction in transmission geometry was used to study the deformations of both phases as a function...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEJ Transactions on Sensors and Micromachines
سال: 1999
ISSN: 1341-8939,1347-5525
DOI: 10.1541/ieejsmas.119.290